To be able to succesfully model OLED stacks, it is important to have high quality refractive index data, across the whole visible spectrum. To obtain this information for new materials we use spectrally resolved variable angle ellipsometry, combined with propriatory modelling. We can do this for single layers or multiple layer thin films as well as oriented samples to obtained detailed refractive index anisotropy or information about molecular alignment. Using ellipsometry we have shown how polymer chain rigidy induces chain alignment in the surface plain of the substrate. This then has a major effect on the outcoupling of light from an OLED devices for example.
Woollam VASE ellipsometer 190nm to 1.6 um spectral coverage
Woollham fitting software